Top>Cutting of IC Bonding Wires

Application


Cutting of IC Bonding Wires

Use of Micro knives.

金線の金傍へ 接合部根本へコンタクト 切断完了

Approach to the joint position of gold wire. (About 25 μm thickness)

Touch the base of joint portion.

Cutting completed




Marking of Sampling Pieces, Marking Lines of Determined Length, Release Location Marking for Measurement Disks, Drawing of Letters/Characters

Use of Tungsten Probes

間隔約3μmのラインが簡単に引けます 精密刻印等が自在です

Lines with intervals of approximately 3μm can be easily drawn

Precise Carved Seals, etc, can be freely created





Remove outer layer of Wire ・ Fiber Cross Sectional Cutting ・ Display Surface
※Cutting, Abrasion

Use of Micro knives.

電線コードへコンタクト V字にカット カット部分を切除し電線露出

Put on outer layer of wire (700μm)

Cut in "V" shape

Remove the cut portion and display surface




Excavation of Foreign Substances in Coating Film, Removal of Embedded Foreign Substances, Peeling of Thin Film

Use of Tungsten Probes
Use of Micro knives.

埋没物の近傍へ 埋没物の掘削 埋没物をプローブでピックアップ

Within approximately 15μm of embedded material

Excavating the embedded material

Picking up the embedded material with a probe




Pick up of Powder, Fallen Foreign Substances, and Cut-off Sample Pieces

Vacuum Absorption (Micro Pipette)

マイクロピペット内径5μm 吸着開始 KBrディスクへリリース

5μm Within 5μm of the Micro Pipette

Start of absorption

Release to a KBr disk




Target Object Inside a Microscopic Hole, Adhesives / Grains / Powders / Liquids

Tungsten Probe

微小ホールの近傍へ 5μmの対象物1粒にコンタクト ピックアップし測定ディスク上へ

Near a microscopic hole with an approximate diameter of 30μm

In contact with one grain of a 5μm target object

Picked up and releases atop a measurement disk




Peeling of Surface  ・ Extracting the Internal Portion of multiple Layer Items ・ Display Surface   ※Rub, Shave

Use of tungsten probe

印刷物表面へ 表面のクリア層を削り内部のインクへコンタクト ピックアップ

Beam to the surface of printing material

Shaving of clear surface and touch the inside ink (Work in about 10 μm area) 

Pick it up (about 5 μm)





Excavation of Foreign Substances in Coating Film ・ Sampling of Embedded Foreign Substances ・ Cutting and Removal of Film ・ Display Surface

Use of Micro knives.

ラッピングフイルムをカット 90°回転させ切出し 測定ディスクへ移動

Cut wraped surface film (PCP)

Turn 90 degrees, cut again and remove it.

Transfer to measurement table.





Adhesives / Fallen Foreign Substances / Surface Execution (by scratching or peeling)

Use of Tungsten Probe

毛髪の近傍へ キューティクルにコンタクト ピックアップ

Near a strand of hair

In contact with a cuticle

Pick up (8μm)

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