{"id":1113,"date":"2016-10-19T13:32:11","date_gmt":"2016-10-19T04:32:11","guid":{"rendered":"http:\/\/microsupport.co.jp\/en\/?p=1113"},"modified":"2022-11-21T10:04:39","modified_gmt":"2022-11-21T01:04:39","slug":"istfa-2016","status":"publish","type":"post","link":"https:\/\/www.microsupport.co.jp\/en\/news-and-topics\/istfa-2016\/","title":{"rendered":"ISTFA\/2016"},"content":{"rendered":"<p>ISTFA\/2016<br \/>\nInternational Symposium for Testing and Failure Analysis<br \/>\n\u00b7&nbsp;November 6-10, 2016<br \/>\n\u00b7&nbsp;Website of the fair : <a href=\"http:\/\/www.asminternational.org\/web\/istfa-2016\/home \">http:\/\/www.asminternational.org\/web\/istfa-2016\/home <\/a><\/p>\n<p>Micro Support showed <a href=\"http:\/\/microsupport.co.jp\/en\/axis-pro-fc\/\">Axis Pro<\/a> which is very useful for Failure Analysis used by FTIR, Raman microscopy, SEM and other analytical equipment.<\/p>\n<p>For more information, please check <a href=\"http:\/\/www.asminternational.org\/web\/istfa-2016\/home\">http:\/\/www.asminternational.org\/web\/istfa-2016\/home<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>ISTFA\/2016 International Symposium for Testing and Failure Analysis \u00b7&nbsp;November 6-10, 2016 \u00b7&nbsp;Website  [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":2725,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[94],"tags":[],"class_list":["post-1113","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news-and-topics"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1113","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/comments?post=1113"}],"version-history":[{"count":1,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1113\/revisions"}],"predecessor-version":[{"id":2771,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1113\/revisions\/2771"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/media\/2725"}],"wp:attachment":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/media?parent=1113"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/categories?post=1113"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/tags?post=1113"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}