{"id":1164,"date":"2017-10-04T14:55:19","date_gmt":"2017-10-04T05:55:19","guid":{"rendered":"http:\/\/microsupport.co.jp\/en\/?p=1164"},"modified":"2022-11-21T10:03:08","modified_gmt":"2022-11-21T01:03:08","slug":"istfa-2017","status":"publish","type":"post","link":"https:\/\/www.microsupport.co.jp\/en\/news-and-topics\/istfa-2017\/","title":{"rendered":"ISTFA 2017"},"content":{"rendered":"<div>ISTFA 2017<\/div>\n<div>\n<div>International Symposium for Testing and Failure Analysis<\/div>\n<div>\u30fbNovember 5-9, 2017<\/div>\n<div>\u30fbPasadena Convention Center (CA, USA)<\/div>\n<div>\u30fbWebsite of the conference:&nbsp;<a href=\"http:\/\/www.asminternational.org\/web\/istfa-2017\/home\" target=\"_blank\" data-saferedirecturl=\"https:\/\/www.google.com\/url?hl=ja&amp;q=http:\/\/www.asminternational.org\/web\/istfa-2017\/home&amp;source=gmail&amp;ust=1507182738341000&amp;usg=AFQjCNGjhfGiO0I7G-vOIjgRmV4uhir-0Q\" rel=\"noopener\">http:\/\/www.asminternational.<wbr>org\/web\/istfa-2017\/home<\/a><\/div>\n<p>&nbsp;<\/p>\n<div>BARNETT TECHNICAL SERVICES showed&nbsp;<a href=\"http:\/\/microsupport.co.jp\/en\/axis-pro-fc\/\" target=\"_blank\" data-saferedirecturl=\"https:\/\/www.google.com\/url?hl=ja&amp;q=http:\/\/microsupport.co.jp\/en\/axis-pro-fc\/&amp;source=gmail&amp;ust=1507182738341000&amp;usg=AFQjCNGAHa5fXkGscyeNBcoA4E0GCRIQ2g\" rel=\"noopener\"><span style=\"color: #0066cc;\">Axis Pro<\/span><\/a>, manipulator combined with microscope whose applications&nbsp;are electrical probing, isolation of small particle and others for Failure Analysis.<br \/>\nFor more information, please check&nbsp;<a href=\"http:\/\/www.asminternational.org\/web\/istfa-2017\/home\" target=\"_blank\" data-saferedirecturl=\"https:\/\/www.google.com\/url?hl=ja&amp;q=http:\/\/www.asminternational.org\/web\/istfa-2017\/home&amp;source=gmail&amp;ust=1507182738341000&amp;usg=AFQjCNGjhfGiO0I7G-vOIjgRmV4uhir-0Q\" rel=\"noopener\">http:\/\/www.<wbr>asminternational.org\/web\/<wbr>istfa-2017\/home<\/a>&nbsp;.<\/div>\n<\/div>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>ISTFA 2017 International Symposium for Testing and Failure Analysis \u30fbNovember 5-9, 2017 \u30fbPasadena Convention C [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":2725,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[94],"tags":[],"class_list":["post-1164","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news-and-topics"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1164","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/comments?post=1164"}],"version-history":[{"count":1,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1164\/revisions"}],"predecessor-version":[{"id":2767,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/posts\/1164\/revisions\/2767"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/media\/2725"}],"wp:attachment":[{"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/media?parent=1164"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/categories?post=1164"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.microsupport.co.jp\/en\/wp-json\/wp\/v2\/tags?post=1164"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}