Applications
We can solve problems that cannot be solved by existing facilities and tools
with a variety of applications using our Micromanipulators, Micro Tools, functional tools, and sampling accessories.
![](https://www.microsupport.co.jp/en/wp-content/uploads/2023/06/Applicationヘッダー.jpg)
APPLICATIONS
Free word search
Keyword search
![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/1-Possible-to-capture-5μm-size-substance-and-deliver-it-in-2-minutes.-300x300-1-300x300.jpg)
An ultrafine probe that Can capture 2-5μm size substances
Tungsten probeFT-IR MicroscopeRaman MicroscopeSEM read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/2-Capture-contamination-on-adhesive-material-and-remove-300x300.jpg)
Grasp and forcibly collect samples that are difficult to pick up
Microtweezer Tool SetFT-IR MicroscopeRaman MicroscopeXRD read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/3-Possible-to-peel-and-capture-microscopic-substances.-300x300.jpg)
Tungsten probe of less than <1μm that effectively peels off objects as small as several μm.
Tungsten probeFT-IR MicroscopeSEMChemical read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/5-Available-to-expose-the-target-point-for-pinpoint-sampling.-300x300.jpg)
Capable of cutting small protrusions and exposing embedded objects on the cutting surface
Ruby KnifeFT-IR MicroscopeSEMElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/6-Micro-press-tools-are-applicable-to-expand-dimension-and-reducing-thickness-of-gels-300x300.jpg)
Thick samples can be crushed to increase the area or make them thinner
Micro Press ToolFT-IR MicroscopeChemical read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/9-Possible-to-control-to-scrape-off-surface-by-every1μm-300x300-1-300x300.jpg)
Semi-automatic cutting of designated areas using Axis Pro
Ruby KnifeFT-IR MicroscopeSEMElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/10-Axis-Pro-automatic-scrape-function-is-possible-to-scrape-off-the-designated-area-with-semi-automatic-control.-300x300.jpg)
Semi – automated surface cutting operations enabled by Axis Pro`s control program
Milling ProFT-IR MicroscopeXRDElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/13-Axis-Pro-automatic-scrape-function-is-possible-to-scrape-off-the-designated-area-with-semi-automatic-control.-300x300.jpg)
Semi – automated surface cutting operations enabled by Axis Pro`s control program.
Milling ProFT-IR MicroscopeElectrical componentChemical read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/16-Available-to-remove-embedded-contamination-in-hard-resin-materials-such-as-PMMA.-300x300.jpg)
Semi – automated surface cutting operations enabled by Axis Pro`s control program
Ruby KnifeFT-IR MicroscopeSEMElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/20-Axis-Pro-software-control-enables-Z-axis-motion-to-synchronize-sequential-liquid-applications.-300x300.jpg)
Axis Pro software control enables Z axis motion to synchronize sequential liquid applications.
Micro injectorMicro PipetteSemiconductorLCD panel read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/24-Micromanipulator-enables-to-control-the-size-which-is-impossible-with-hand-held-devices-300x300.jpg)
Micromanipulator enables to control the size which is impossible with hand-held devices.
Micro PipetteSemiconductorLCD panelBattery read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/25-Micro-tweezers-applicable-to-capture-and-transfer-micro-level-device-precisely-300x300.jpg)
Precise grasping and manipulation of microscopic samples using micro-tweezers
Microtweezer Tool SetFT-IR MicroscopeSemiconductorLCD panel read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/26-Lift-out-posture-control-and-delivery-of-FIB-samples-300x300.jpg)
Lift-out, posture control and delivery of FIB samples (10µm)
Super fine pitch rotatorMicro Sampling ToolTEMFIB-SEM read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/27-Possible-to-mark-5μm-width-lines-on-hard-materials-300x300-1-300x300.jpg)
Precise surface marking on hard materials, including glass, silicon wafers, and metals facilitated by hard metal tools
Tungsten carbide probeFT-IR MicroscopeRaman MicroscopeFIB-SEM read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/30-Hard-metal-tools-are-available-to-make-microscopic-markings-on-hard-materials-such-as-metal-1-300x300.jpg)
Hard metal tools are available to make microscopic markings on hard materials such as metal.
Tungsten carbide probeFT-IR MicroscopeRaman MicroscopeTEM read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/31-By-setting-microscopic-targets-while-observing-with-an-installed-microscope-a-diamond-penetrator-marks-the-point-automatically-300x300.jpg)
Automatic diamond and other markings with our compact desktop micromarking dedicated machine, D-MARK
D-MARKFT-IR MicroscopeRaman MicroscopeTEM read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/34-Possible-to-set-targets-freely-to-trim-microscopic-location-of-films-or-to-expose-foreign-particles-in-films.-300x300.jpg)
Precise cutting can be performed when sampling film cutout portion with modified properties or embedded foreign particles.
Micro KnifeFT-IR MicroscopeBatteryElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/36-Axis-Pro-with-tungsten-probe-enables-to-check-conduction-of-a-few-μm-level-wiring-pattern.-300x300-1-300x300.jpg)
Axis Pro with tungsten probe enables to check conduction of a few µm level wiring pattern.
Manual ProberElectrode HolderTungsten probeBattery read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/37-Axis-Pro-with-tungsten-probe-enables-resistance-measurements-of-a-few-μm-level-wiring-pattern.-300x300-1-300x300.jpg)
Resistance measurement of a few μm wiring patterns by setting tungsten probes on our micromanipulators
Manual ProberTungsten probeBatteryElectrical component read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/38-Collection-Pro-can-automatically-separate-out-grains-based-on-size-color-and-shape.-300x300.jpg)
Collection Pro can automatically separate out grains based on size, color and shape.
Collection ProRaman MicroscopeSEMSynchrotron Radiation read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/41-Axis-Pro-automatic-scrape-function-is-possible-to-scrape-off-the-designated-area-with-semi-automatic-control.-300x300.jpg)
Axis Pro automatic scrape function is possible to scrape off the designated area with semi-automatic control.
Milling ProFT-IR MicroscopeElectrical componentAutomobile read more![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/10/42-Axis-Pro-enables-easy-preparation-for-AFM-measurement-easily.-300x300.jpg)