Applications
Isolation of μm-size particles for FT-IR, Raman and SEM
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Scraping thin sections of material from a surface
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Microwelding and various sampling for materials science and geoscience
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Ex-situ FIB lift-out
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Sample marking for SEM
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DAC loading for high pressure
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Precise cutting of samples
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Probing for electric measurement
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Automatic collection and sorting of grains
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Sampling inside a glove box
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Attachment of colloidal probes to cantilevers for AFM measurements
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Cell isolation
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Application
 Isolation of μm-size particles for FT-IR, Raman and SEM |
| Scraping thin sections of material from a surface |
| Microwelding and various sampling for materials science and geoscience |
| Ex-situ FIB lift-out |
| Sample marking for SEM |
| DAC loading for high pressure |
News&Topics
| Microsampling application for semiconductor customers【Micro Support Newsletter Vol.4】() |
| Simple marking of small object on sample【Micro Support Newsletter Vol.3】() |
| Automatic Grain Manipulation System with AI【Micro Support Newsletter Vol.2】() |
| New accessory for TEM lamella ex-situ lift out【Micro Support Newsletter Vol.1】() |
| MICRO TOOLS & ACCESSORIES SELECTION GUIDE() |
