|Isolation of μm-size particles for FT-IR, Raman and SEM|
|Scraping thin sections of material from a surface|
|Microwelding and various sampling for materials science and geoscience|
|Ex-situ FIB lift-out|
|Sample marking for SEM|
|DAC loading for high pressure|
|Microsampling application for semiconductor customers【Micro Support Newsletter Vol.4】()|
|Simple marking of small object on sample【Micro Support Newsletter Vol.3】()|
|Automatic Grain Manipulation System with AI【Micro Support Newsletter Vol.2】()|
|New accessory for TEM lamella ex-situ lift out【Micro Support Newsletter Vol.1】()|
|MICRO TOOLS & ACCESSORIES SELECTION GUIDE()|
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